FOCUSED ION BEAM: A "TOOL" FOR MICRO/NANO FABRICATION & CHARACTERIZATION

  24/02/2021 - 15:00 CET

The talk will show a "fairly new" technology for micro and nano fabrication and characterization. It will face the Focused Ion Beam (FIB) technology, a tool available on the market form the early 2000s. With a FIB it is possible to image and to modify materials at micro and nanoscale by milling and deposition. Despite its complex architecture, it is a relative user-friendly machine, above all when it is included in a Dual Beam system with Electron Microscope.

The webinar will cover the following topics:
- Imaging and micromachining at nanometer-micrometer scale
- Surface modification and analysis
- Maskless micromachining and nano tomography
- Material Science and biological applications

The webinar is recommended to Academic Researchers and Technicians on Nanotechnology, Material Science, Cultural Heritage, people from R&D Teams of Nanotech industry in different fields of application (bio, fluidic, pharma, IC, etc.)  and to scientific dissemination entities on the state-of-the-art of the nano technology.

By Dr. Giuseppe Firpo

By University of Genova – Physics Department

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Focused Ion Beam: a "tool" for Micro/Nano fabrication & characterization
24/02/2021
Dr. Giuseppe Firpo

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Focused Ion Beam: a "tool" for Micro/Nano fabrication & characterization
24/02/2021
Dr. Giuseppe Firpo

  
  

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